Angle-Resolved X-Ray Photoelectron Spectroscopy (ARXPS) as a New Tool for Solid Surface Characterization
نویسندگان
چکیده
منابع مشابه
Angle - resolved X - ray photoelectron spectroscopy ( ARXPS ) and a modified Levenberg - Marquardt fit procedure : a new combination for modeling thin layers
The combination of angle-resolved X-ray photoelectron spectroscopy (ARXPS) and a modified Levenberg-Marquardt (LM) fit procedure has been used to study a native oxide layer on a clean Si(100) substrate. Numerical calculations show that with an aperture of 3 o or 9 o of the electron analyser, the photoelectron take-off angle should not exceed 80 o or 70 o, respectively, as compared to normal tak...
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ژورنال
عنوان ژورنال: Proceedings of the Japan Academy, Series B
سال: 1980
ISSN: 0386-2208,1349-2896
DOI: 10.2183/pjab.56.654